Data/hora: 19/05/2024 02:01:36

Biblioteca(s): 	Embrapa Cerrados.	
Data corrente: 	26/12/2013	
Data da última atualização: 	26/12/2013	
Autoria: 	MORAES, S. V. de P.; HUNT, T. E.; WRIGHT, R. J.; HEIN, G. L.; BLANKENSHIP, E. E.	
Afiliação: 	SILVANA VIEIRA DE PAULA MORAES, CPAC; UNIVERSITY OF NEBRASKA-LINCOLN; UNIVERSITY OF NEBRASKA-LINCOLN; UNIVERSITY OF NEBRASKA-LINCOLN; UNIVERSITY OF NEBRASKA-LINCOLN.	
Título: 	Western bean cutworm survival and the development of economic injury levels and economic thresholds in field corn.	
Ano de publicação: 	2013	
Fonte/Imprenta: 	Journal of Economic Entomology, College Park, v. 106, n. 3, p. 1274-1285, 2013.	
DOI: 	http://dx.doi.org/10.1603/EC12436	
Idioma: 	Inglês	
Conteúdo: 	Western bean cutworm, Striacosta albicosta (Smith) (Lepidoptera: Noctuidae), is a native pest of dry beans (Phaseolus vulgaris L.) and corn (Zea mays L.). Historically, the western bean cutworm was distributed in the western United States, but since 1999 eastward expansion has been observed. In corn, economic impact is caused by larval ear feeding. Information on western bean cutworm biology, ecology, and economic impact is relatively limited, and the development of economic injury levels (EILs) and economic thresholds (ETs) is required for more effective management. Studies during 2008Ð2011, across three ecoregions of Nebraska, sought to characterize western bean cutworm survival and development of EILs and ETs. Calculations of EILs and ETs incorporated the dynamics of corn price, management cost, and pest survival. The results from the current study demonstrated low larval survival of this species (1.51Ð12.82%). The mean yield loss from one western bean cutworm larva per plant was 945.52 kg/ha (15.08 bu/acre), based on 74,100 plants per ha. Economic thresholds are expressed as a percentage of plants with at least one egg mass. This study is the Þrst study that explicitly incorporates variable management costs and crop values into western bean cutworm EIL calculations, and larval survival into ET calculations.	
Palavras-Chave: 	Bean; Nivel de dano ecônomico; Resistência larval; Striacosta albicosta; Western bean cutworm.	
Thesagro: 	Feijão; Lagarta; Lagarta rosca; Milho; Praga de planta.	
Thesaurus Nal: 	Biological resistance; Corn; Economic threshold; Larval development; Pests; Richia albicosta; United States.	
Categoria do assunto: 	O Insetos e Entomologia	
URL: 	http://ainfo.cnptia.embrapa.br/digital/bitstream/item/94467/1/33774.pdf	
Registro original: 	Embrapa Cerrados (CPAC)	
Exemplares: 	CPAC - (33774-1) - UPC - AP - PP - S1647 -  - 2013.01647 - DIS